- Industry: Semiconductors
- Number of terms: 2987
- Number of blossaries: 0
- Company Profile:
National Semiconductor Corporation designs, develops, manufactures, and markets analog and mixed-signal integrated circuits and sub-systems.
Conventional CMOS integrated circuit processes so called because they are diffused into bulk silicon rather than on a substrate such as sapphire.
Industry:Semiconductors
Those characteristics of hardware or software which allow its transferal from one system to another system and to interface compatibly with the hardware and software of the new system.
Industry:Semiconductors
Random impurities of uncontrolled location and density present in the bulk silicon of the wafer prior to the diffusion processes. Bulk impurities are of concern because of the growth of the various oxide layers employed during the diffusion process can result in impurity relocations and concentrations. Concentrated impurities (which are typically oxygen, carbon, or sulphur) can create unwanted parasitic or various types of latent defects that can lead to premature failure.
Industry:Semiconductors
The creation of electrostatic charge that occurs when two surfaces contact and then separate, leaving one positively charged and the other negatively charged.
Industry:Semiconductors
The application of electrical biases to a device while operating it at an elevated temperature (usually 125°C), normally as a 100% screening test. Standard burn-in durations are 160 hours for Class B devices and 240 hours for Class S. This test is designed to "weed out" devices subject to infant mortality or excessive parametric drift.
Industry:Semiconductors
The step in the assembly process for devices assembled on a lead frame (such as flatpacks and dual-in-line packages) where the lead frame is trimmed off and the leads bent or formed into their specified positions.
Industry:Semiconductors
Large amounts of rapid dose rate ionizing radiation [normally in excess of 108 rads (Si)/sec] resulting in device latch-up, data upset, threshold shift or other performance degradation. Burst radiation is usually associated with nuclear weapon detonation.
Industry:Semiconductors
For a logic device, a table showing the output logic states that would result from each of the possible input logic combinations the device is designed to accept.
Industry:Semiconductors
The use of computer automation in the implementation of all or a portion of a design for a complex circuit.
Industry:Semiconductors
A term applied to devices with complexity levels in excess of 10,000 gates.
Industry:Semiconductors
